Advantest Intros Memory Test Solution for DDR3-SDRAM Memory

Advantest Corporation has announced its T5503 memory test system, the parallel test capability of up to 128 devices. With maximum test speeds of 3.2 Gbps and data transmission speeds of over 1 Gbps, T5503 is deigned for package testing of up to 128 DDR3-SDRAM devices simultaneously. It has semiconductor circuitry that utilizes CMOS technology and is also suited for testing GDDR3 and GDDR4 devices. Support is also provided for source-synchronous test with use of multi-strobe technology, which measures phase difference between data output from device and reference clock signal at each clock cycle.