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Viscom Launches X7056, Inspection System
(Product News, 23 Jun 2008 )
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Viscom has launched its X7056, inspection system, with its inspection solution carries out both AOI and AXI simultaneously. The system is equipped with the Viscom microfocus X-ray tube, which ensures a resolution up to 8 µm/pixel in the X-ray area. The inspection system shines with a high positioning accuracy, which enables high-precision 3-D X-ray evaluations. Due to the integration of the optical 8M camera technology, the system offers the high inspection depth of the AOI systems at comparable throughput. With the flexible OnDemandHR function the AOI resolution can be switched from 23.4 to 11.7 µm/pixel with the full image field size for any analysis. In addition, the inspection system provides a color evaluation. With its simultaneous optical and X-ray inspection, the combined system sets standards in quality assurance. This combined inspection and the axis system achieve inspection times and short PCB handling times. The system is completely modular and can be used as a combined system or as a pure AXI system. These different inspection concepts can be flexibly implemented depending on the customer's requirements.
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