Credence Systems Corporation has announced the quad broadband integrated transceiver (QBIX) instrument for its Sapphire SoC test platform. With more than fifty QBIX instruments shipped for use in IC characterization and production, QBIX addresses a wide range of device test applications, including DTV, audio/video DAC/ADCs, xDSL, IF, cellular baseband, set-top boxes and DVDs. QBIX, the ATE bidirectional multi-channel instrument, optimizes test performance on a variety of complex SoC devices with single-ended and differential I/O paths, increasing yield and lowering cost-of-test.
Each QBIX channel is capable of "on-the-fly" switching between source and measure, and between high frequency and high resolution. One QBIX instrument has the flexibility to replace up to sixteen separate analog instruments commonly found on traditional ATE systems. Additionally, QBIX provides several additional features to further augment cost-of-test performance. A high-throughput DSP architecture is matched by a powerful, optimized DSP library with over 200 functions. Intuitive graphical software tools enable rapid development and debug of mixed-signal test programs and its per pin PMUs (parametric measurement units) on each I/O pin support rapid continuity measurements. These essential features make Sapphire with QBIX one of the highest-yielding, lowest cost-of-test solutions for complex SoC testing.
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